The International Conference on
Compound Semiconductor Manufacturing Technology

"Sharing Ideas Throughout the Industry"
 2009 Conference Workshops

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Moving from Reliability to Manufacturability
Bill Roesch, TriQuint Semiconductor
Failure Analysis – Fault Localization
Kevin Berger, Analytical Solutions, Inc
Transmission Electron Microscopy Based Failure Analysis
Mike Salmon, Evans Analytical Group
Electrical, Thermal and Environmental Reliability of Transistors:  Experimental Techniques to Identify Fundamental Degradation Mechanisms
Professor Jesus del Alamo, Massachusetts Institute of Technology
Fully Coupled Process and Device Simulation for Understanding Reliability
Professor Mark Law, University of Florida
Modern Thermography for Semiconductor Technology for Reliability Testing: Channel Temperature and Stresses/Strains in Devices
Professor Martin Kuball, University of Bristol